Used HITACHI S-5000 #9114730 for sale

ID: 9114730
Vintage: 1998
Field emission scanning electron microscope (FE-SEM) High magnification: 500x to 1,000,000x Low magnification: 30x to 2,000x Electron gun 3-Stage electromagnetic lens Electromagnetic astigmatism correction coil CRT Monitor Automatic valve system (3) Vacuum ion pumps Compressor 1998 vintage.
HITACHI S-5000 is a state-of-the-art semi-field emission scanning electron microscope (SEM) equipped with an advanced electron optical equipment, a high-resolution detector, and a newly developed ultra-high brightness ultra-stable cold field emission electron source. This high-performance device is capable of capturing and displaying images with an unparalleled level of detail. HITACHI S 5000's electron optical system is designed for extremely fast and precise sample imaging. It consists of a combined accelerating/deflecting unit, an objective lens, and multiple scanning coils. The accelerating/deflecting unit combines conventional accelerating and deflection elements into one, eliminating the need for adjustment when changing magnification. This combined unit also features improved objective lens aberrations, resulting in higher image resolution, which is essential in modern microscopy. The device's high-resolution detector combines both secondary and backscattered detectors, facilitating high quality SEM images and detection of subtle sample structures. Additionally, the high-performance detectors offer low noise and a high dynamic range, providing excellent contrast and resolution in images. S-5000 also features a newly developed ultra-high brightness ultra-stable cold field emission electron source. This source features a low electron temperature, ensuring the electron beam is stable, providing a sharply focused spot image that helps ensure accurate and detailed images. Additionally, the source has an ultra-stable electron current, ensuring a constant brightness throughout the day. Furthermore, the new source features unique built-in functions such as a dedicated sample viewing chamber and gas inlet connections that facilitate the addition of gases for a variety of specialized techniques. These features combined with the ability to observe samples using a variety of additional detectors help make S 5000 an excellent choice for a wide variety of applications. HITACHI S-5000 is further complemented by a user-friendly computer control software. The intuitive software features a graphical interface that helps users quickly and accurately configure the microscope for their particular needs and applications. This control unit also features an integrated autostage machine, allowing users to rapidly move between samples for quick and easy image capture. Overall, HITACHI S 5000 offers researchers and scientists a powerful and versatile SEM tool designed for modern microscopy. With its advanced electron optical asset, high-resolution detectors, and ultra-high brightness ultra-stable cold field emission electron source, S-5000 is a truly exceptional SEM instrument and a great choice for those looking to push the boundaries of microscopy.
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