Used HITACHI S-5000 #9134032 for sale

HITACHI S-5000 scanning electron microscope is a powerful analytical tool capable of high-resolution imaging and detecting extremely small differences in sample structures. This microscope is capable of imaging samples with a resolution down to 1 nanometer and using its Energy Dispersive X-Ray Analysis (EDXA) to spectrum and analyze the elemental composition of samples without causing damage to the sample. The ability to image and analyze at such a small scale provides a wealth of information to researchers in many disciplines. The operator of HITACHI S 5000 is given a wide range of control over the instrument's settings and imaging parameters from its user-friendly control panel. An electrostatic lens system is used to control the electron beam which is used to scan and image samples. While automatic focusing of the beam can be used, the operator may also choose to manually adjust the focus of the beam to optimize their imaging. The voltage of the beam can also be adjusted to obtain desired levels of magnification without altering the sample. S-5000 can be used in various stages of sample preparation, allowing images of samples before and after further processing. For example, samples can be extracted from a vacuum chamber and imaged on S 5000 afterwards. This can be especially useful for examining the results of sample infiltration filling techniques used by many material scientists. HITACHI S-5000 is equipped with two detectors that can be used to detect the emitted secondary electrons to form images of samples. The first detector is optimized to detect standard secondary electrons which can provide a detailed topographical view of samples. The second detector is designed to detect backscattered electrons which provide a different type of image formation. The combination of these two detectors offers a unique view of a sample that can reveal features that could not be observed with each detector individually. This versatility, combined with the small size and high resolution of the microscope make HITACHI S 5000 an ideal instrument for a wide range of sample characterization needs.