Used HITACHI S-5000 #9382984 for sale

HITACHI S-5000 is an advanced scanning electron microscope (SEM) designed to provide high resolution imaging of a variety of specimen types. The microscope boasts a high accelerating voltage—up to 200 kV—and features a large chamber that can accommodate samples up to 25 mm in diameter and mounted on SEM holders. The combination of high resolution imaging and large sample size makes HITACHI S 5000 an ideal choice for a variety of imaging applications including materials research, failure analysis, and microelectronics studies. S-5000 is equipped with a cold FEG (field emission gun) electron source with a W filament which provides highly reliable and stable performance for a range of accelerating voltages. The dust cover on the gun provides reliable protection from environmental contamination, while the robust design of the gun ensures minimal drift, allowing for sharp and consistent images. The SEM includes a large-area (up to 340 mm) segmented scintillator equipment for detection of the emitted electrons, providing high-sensitivity detection of samples across all magnifications. The optical system features a pair of variable aperture lenses with a variable focal length of 32-200 mm, allowing the user to quickly change the magnification of the image with a single knurled knob. The segmented scintillator unit allows for increased beam current than an unbent detector, which reduces the electron exposure time for high-speed imaging applications. For elemental analysis, S 5000 is equipped with an energy dispersive X-ray spectrometer (EDS). The EDS machine utilizes five oxide semiconductor detector elements to acquire X-ray spectra, enabling the user to obtain quantitative elemental analysis of digital images. The EDS tool is also equipped with a wide range of filters, allowing the user to adjust the signal sensitivity for a range of elements with energies from 0.1 to 15 keV. The microscopy features the important advantage of a digital interface, allowing connection to computers or other elements of the asset. Combined with the acquisition software and data processing capabilities, this makes HITACHI S-5000 an ideal instrument for analysis and imaging. Furthermore, the flexibility of the software provides an easy-to-use graphical user interface (GUI) alongside easy changeover for a range of operations. HITACHI S 5000 also features a range of automated processes that support the sample scanning procedure, such as auto-focusing and adjustable feet on the main body of the SEM that enable the user to reliably prove samples. This functionality makes S-5000 an ideal choice for researchers and scientists who need a reliable, high-performance scanning electron microscope.