Used HITACHI S-5000H #9221584 for sale
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ID: 9221584
Wafer Size: 8"
Vintage: 1998
Vertical scanning electron microscope (SEM), 8"
Display unit:
Monitor
Photo unit
HV Tank
Column unit:
TMP
Head AMP
Heater unit
Power supply:
DC Power unit
Objective lens power
TMP Unit
IP Power unit
Power supply unit
W-4030 Water circulatory
Air compressor
(2) R-Pumps
Accessories:
Ion pump power supply
Tool box
(4) Sealing units
EMI Compensation system
Anti-vibration table
(3) Cables
Manuals
1998 vintage.
HITACHI S-5000H is a scanning electron microscope (SEM) that combines high resolution imaging with a high speed analysis system. This SEM has a unique feature called the "Hybrid Image Technology" which integrates two functions for image acquisition - secondary electron imaging and backscatter electron imaging for enhanced signal-to-noise performance. It has a magnification ranging from 1000 to 1,000,000 times with a resolution as low as 0.2 nanometers at 30kV resulting in high-resolution imaging of the sample specimen. Additionally, the life cycle of the electron source is extended with the automatically adjustable focal control. HITACHI S 5000H has a 16bit high dynamic range monochrome digital signal output, with an analog signal output of 64Vpp. This allows for a range of image characteristics including contrast, brightness and image inversion. RAW data of 8bit/16bit, RGB data, 3D data, GIS data and other novel image analysis data are all possible with this SEM. It also has a wide range of motion control features, such as the stage tilt, shift, and rotate functions. The stage has a sample size range of up to 45 mm in diameter, so large samples can be analysed with ease. An anti-vibration table reduces vibration from outside sources, ensuring high quality image resolution. Moreover, advanced features such as Auto Adjustment, Intelligent Lens Control System and Real-Time Cooling make this SEM a versatile instrument. The Auto Adjustment feature removes human error by automatically detecting and adjusting detector settings for optimum image quality, while the Intelligent Lens Control System selects the most suitable electron source lens depending on the conditions of the specimen being examined. The Real-Time Cooling feature keeps the sample temperature at a constant level, allowing the specimen to be imaged correctly without damage. Finally, the user-friendly graphical interface allows for easy navigation and operation making S-5000 H simple to use. This highly advanced SEM is an ideal instrument for imaging samples with nanometer-scale resolution and fast image acquisition.
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