Used HITACHI S-510 #293641012 for sale

HITACHI S-510 scanning electron microscope (SEM) is a state-of-the-art, high-performance analytical tool for examination of the structure and composition of a wide range of materials. S-510 features an advanced in-lens secondary electron detector and scanning electron optics equipment that allows for high-resolution imaging with increased depth of field and larger depth of focus. The microscope includes high-accuracy mechanical components for optimum imaging resolution and precise positioning of the sample, a digital imaging and control panel, an advanced electronic digital signal processor, and an environmental containment chamber. HITACHI S-510 has a two-stage digital scanning mechanism that allows precise beam control. This system uses bilateral digital signal processing to optimize sensitivity, resolution, and stability of the scanning electron beam. The digital signal-processing unit reduces noise and interference to produce high-quality images. The microscope also has a high voltage power supply and digital image processor to provide improved image quality compared to standard optical microscopes. S-510 is equipped with an environmental chamber that contains both a vacuum machine and filtration tool for temperature, humidity, ozone, and other gases. This chamber provides superior sample protection when examining samples that are particularly sensitive to ambient environment. In addition, the chamber creates a flexible imaging environment to optimize imaging dynamics in a variety of sample types. HITACHI S-510 also incorporates an automatic sample loading asset and an advanced sample-holder positioning model that enables accurate and repeatable positioning of specimens. The microscope also has an integrated digital image platform, which is used to process images and perform a range of operations automatically. The platform allows both manual and automated image processing and reporting. S-510 provides powerful analytical capabilities for a wide range of materials and applications. With its high image resolution and depth of focus, the microscope is perfect for examining microstructures, nanostructures, and composite materials. It is also ideal for research and industry applications, such as failure analysis, materials testing, and electronics and semiconductor inspection.