Used HITACHI S-520 #187760 for sale

ID: 187760
Scanning electron microscope.
HITACHI S-520 Scanning Electron Microscope (SEM) is one of the most advanced imaging tools used in surface and material analysis. It can magnify up to 230,000 times and offers a wide range of useful advanced features. This type of microscopy uses a focused beam of electrons to generate a highly detailed image, which can reveal inner structures of specimens down to a submicron level. The system has a large array of direct detector options, including an energy-dispersive X-ray (EDX) detector for elemental analysis, a secondary-electron detector for imaging, an electron-transmission detector for backscattered electron imaging, and a special electron-dispersive X-ray (EDX) detector for particle analysis. S-520 can also be used for many materials including metals, ceramics, composites, semiconductors, nanostructures, and biological samples. The backscattered electron (BSE) and secondary electron (SE) detectors can be used to detect surface topography or defect mapping, while the EDX detector enables the user to acquire elemental data and performs chemical analysis of the sample. HITACHI S-520's chamber is maintained at a high vacuum to reduce the contamination of the sample and to improve the clarity of the observed image. It is also equipped with powerful functions such as auto-tilt and high-speed autocollimation so that sample orientation can be adjusted to obtain optimum imaging. S-520 supports both manual and automated sample scanning and imaging, greatly enhancing its ability to acquire large amounts of high-resolution images in a limited period of time. The system is compact and highly customizable, with a wide range of optional accessories, such as a cooling unit, a high-temperature stage, and a charge eliminator. The software interface is user-friendly and can be adapted to the user's application needs. Overall, HITACHI S-520 Scanning Electron Microscope is a flexible and highly efficient imaging tool that allows users to visualize and analyze the inner structure of various materials, from macro to micro. Its high-resolution capabilities and wide range of advanced features make it an ideal instrument for a variety of scientific and industrial applications.
There are no reviews yet