Used HITACHI S-5200 #293608981 for sale

HITACHI S-5200 is a scanning electron microscope (SEM) designed to observe the surface of samples in a range of conditions with excellent resolution. Utilizing a variety of detectors, HITACHI S 5200 offers a range of scanning capabilities, enabling researchers to gain precise information about the surface structures of the sample. The microscope is equipped with a scanning electron source, which is capable of producing electrons with a maximum energy of 15 keV. The SEM is also equipped with a variety of detectors, which allow for different types of imaging, including secondary electron imaging and backscattered electron imaging. Additionally, the microscope has a powerful computer control system, which allows for precise scanning, as well as an automatic sampler for precise sample positioning. S-5200 is an equipped with a variety of techniques for sample surface analysis, including X-Ray microanalysis, electron backscatter diffraction (EBSD), energy-dispersive x-ray spectroscopy (EDS), and photoelectron spectroscopy (PES). These techniques enable researchers to identify the elemental composition of the sample and gain insight into the material's structure and properties. Additionally, the microscope is capable of imaging at sub-nanometer resolutions, allowing for clear visualization of atomic-scale features. S 5200 incorporates an array of advanced features, such as variable temperature and variable pressure control, in order to provide a range of controlled environments under which the sample can be observed. Additionally, the microscope enables users to adjust the spot size of the electron beam using its beam spot control, offering precise imaging and data analysis capabilities. In conclusion, HITACHI S-5200 is an incredibly powerful scanning electron microscope designed for a wide variety of surface analysis tasks. Utilizing the microscope's powerful scanning and imaging systems, researchers can obtain precise information about the elemental composition and structure of a variety of samples. The microscope also has a well-designed control system, allowing for precise sample positioning, as well as a variety of conditions and controls for more detailed investigations.