Used HITACHI S-5200 #9083667 for sale

HITACHI S-5200 is a high-performance scanning electron microscope (SEM) designed to enable detailed characterization of microstructures. It offers superior low-beam imaging capability, allowing researchers to obtain images at high magnifications with high resolution and contrast. The microscope is capable of resolutions down to 0.5 nm, allowing microstructural details to be revealed, allowing characterization of nanoscale structures. HITACHI S 5200 is equipped with a Variable Pressure (VP) mode, which enables imaging in a range of pressure settings, from near atmospheric to low vacuum (down to 4.5 Pa). This allows for imaging of non-conductive specimens, as well as for a wider range of sample sizes to be viewed. Furthermore, the VP mode also enables the use of alternative techniques such as Low Vacuum Occluded Carbon Coating (LVOCC) for improved imaging of non-conductive samples. S-5200 has a high degree of automation, allowing automated sample loading and unloading, and automated selection of imaging parameters. This allows researchers to rapidly acquire SEM images, and eliminates the need for lengthy setup times and manual intervention. Additionally, the automated equipment allows users to easily repeat experiments for the same sample in order to ensure repeatability of results. S 5200 is equipped with an EDX system for elemental analysis. This unit utilizes X-rays generated within the electron beam to detect elements present in the sample; this allows researchers to perform qualitative and quantitative analysis of the sample. The details of elemental distribution within the sample can also be extracted using the EDX machine, enabling researchers to gain insight into the internal microstructural features of the sample. Overall, HITACHI S-5200 is a powerful scanning electron microscope which offers superior resolution and contrast compared to traditional imaging systems. Its versatility and automation allows for users to rapidly collect and analyze data, while the EDX tool enables detailed elemental analysis. It is a valuable tool for researchers looking to characterize nanoscale materials.