Used HITACHI S-5200 #9123188 for sale

HITACHI S-5200 scanning electron microscope (SEM) is a versatile imaging and analytical platform designed to meet the high demands of users such as scientists and technicians in the field of analytical electron microscopy. HITACHI S 5200 is a fully customized version of the popular and reliable S-4800 model with improved features that enhance its imaging capabilities. S-5200 features an advanced high-resolution InLens detector equipment, advanced auto-stigmunation and image formation system, and a user-friendly control panel. The InLens detector unit amplifies signals and achieves a higher detector resolution at lower voltages, providing a clear, detailed image. The advanced auto-stigmunation and image formation machine allows for automated specimen scanning and adjustment settings for an optimized imaging and analysis process. The user-friendly control panel also allows for simple and convenient operation of the microscope tool. Additionally, S 5200 can produce high resolution images with advanced SEM imaging operation capabilities. It provides high resolution imaging up to 8nm, making it ideal for measuring the topography of down to nanoscale dimensions. It is also capable of acquiring true color-contrast imaging for easy identification of components under a SEM with 4x4x4nm method. Furthermore, the microscope comes with various imaging modes such as high-vacuum, low-vacuum, environmental, and low-vacuum-environmental. With these features, HITACHI S-5200 provides versatility when conducting analytical electron microscopy. HITACHI S 5200 also features a 10-sheet image collection unit that can save a maximum of 10,000 images into a single file. The images are then converted into a simple text file format, allowing easy access to data and rapid image processing. The unit also allows for conventional preparations using binocular accessories, so the sample remains in its original condition. Overall, S-5200 SEM is a powerful and reliable imaging and analytical tool with advanced features and functions for advanced imaging and analysis of samples. It is suitable for many applications in various fields of electron microscopy.