Used HITACHI S-5200 #9214085 for sale

HITACHI S-5200 Scanning Electron Microscope (SEM) is a benchtop scanning electron microscope that utilizes an energy dispersive X-ray analyzer (EDS) to analyze specimen composition. It has a wide range of applications in industry, such as for material analysis, metallurgical microstructural analysis, biological specimen examination, and failure analysis. The equipment is equipped with a monochromatic, high-resolution electron column, field emission gun (FEG) for high resolution imaging, and a scanning stage that allows for stage scanning and tilting from 0-45 degrees. It can be operated in scanning and/or inanalysis mode. HITACHI S 5200 is capable of producing high quality images with a magnification range of 0.2 to 200,000 times the original size. The FEG has a vacuum system that maintains a pressure of 10-6 Torr, so the electron beam is focused and stable at low accelerating voltage. Its high resolution scanning produces high-quality images and facilitates the acquisition of accurate topographical information of any given structure. The unit is also equipped with an EDS machine which uses energy-dispersive X-ray spectroscopy (EDS) to analyze elements within a sample. It has a sophisticated hardware architecture which allows for both a fast and reliable data acquisition. It can pick up minute signals and produces highly reliable and precise elemental compositions. This allows for more accurate analysis and interpretations of a sample's composition. In addition, S-5200 has secondary electron, backscattered and scanning transmission imaging capabilities which provide better understanding of different artifacts and sample topology. The high-speed digital image processing also provides faster operation and analysis. In summary, S 5200 Scanning Electron Microscope is a powerful, versatile, and accurate tool that produces high resolution images and allows for detailed analysis. It uses an FEG and EDS asset to facilitate accurate readings and data acquisition, and provides higher imaging and quantification.