Used HITACHI S-5200 #9235454 for sale
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ID: 9235454
Field Emission Scanning Electron Microscope (FE-SEM)
Stage: Fully automatic
SE Detector
HITACHI FE Tip
(4) Barion ion pumps
NT340M Turbo pump
3 Axis motor stages (X, Y, Title) Z axis manual
Section holder
LCD Monitor
COMPAQ Deskpro EN
Trac ball joystick
Control panel
COMPAQ Keyboard
COMPAQ Mouse
Down transformer
No scroll pump
Specifications:
Resolution:
Accelerating voltage: 30 kV
Working distance: 4 mm - 0.6 nm
Accelerating voltage: 1 kV
Working distance: 1.5 mm - 2.5 nm
Magnification:
High magnification mode: 500x - 1000,000x
Low magnification mode: 30x - 2,000x
Electron optics:
Electron gun: Cold cathode field emission
Extracting voltage (Vext): 0 - 6.5 kV
Accelerating voltage (Vacc): 0.5 - 30 kV (in 100 V steps)
3-Stage electromagnetic lens, reduction type
Objective lens aperture: Movable aperture (4 Openings selectable / alignable outside column)
Self cleaning thin aperture
Astigmatism correction coil (Stigmator) type: Electromagnetic
Scanning coil type: 2-Stage electromagnetic deflection
Specimen stage:
S-5200 Motor stage
X Traverse: ± 3.5 mm
Y Traverse: ± 2 mm
Z Traverse: ± 0.3 mm
Tilt: ± 15°
Specimen size: 9.5 mm x 5 mm x 2.4 mmH (Diameter)
Display unit:
Photo CRT (Option): Ultra high resolution type (Effective field of view 120 × 90 mm)
Scanning modes: (Normal scan)
Reduced area scan
Line scan
Sport analysis
Average concentration analysis
Scanning speeds: TV (640x480 pixels display: 25 / 30 flames)
Fast (Full screen display: 25 / 30 flames/s)
Slow (Full screen display: 1/0.9, 4/3.3, 20/16, 40/32, 80/64 s/flame)
(640x480 pixels display: 0.5/0.4, 2/1.7, 10/8, 20/16, 40/32 s/flame)
Evacuation system:
Fully automatic pneumatic valve system
Ultimate vacuum level:
Specimen chamber: 7 x 10-4 Pa
Electron gun chamber:
IP-1: 1 x 10-7 Pa
IP-2: 2 x 10-6 Pa
IP-3: 7 x 10-5 Pa
Vacuum pumps:
Electron optical system: (3) Ion pumps
Specimen chamber: Turbo molecular pump
(2) Oil rotary pumps
(4) Compressors
Protection devices:
Power failure
Cooling water interruption
Inadequate vacuum
Operating system: Windows NT.
HITACHI S-5200 is a scanning electron microscope (SEM) that provides a high level of image quality. It is a variable pressure SEM, allowing users to work at various amounts of pressure beside the workpiece. HITACHI S 5200 is equipped with an electron gun that produces a beam of electrons, a specimen stage with a scanning platform and a detector that records the first to fourth orders of secondary electrons. Also, S-5200 has a digital image-recording equipment for conventional learning and a computer-controlled high resolution image-recording system. In addition, the microscope is capable of image capture and processing operations. The specimen stage of S 5200 has two columns that support the specimen platform. It also has an XY unit and a laser drift-monitoring machine, which keep the field of view fixed. Moreover, a range of objective lenses are available for HITACHI S-5200, providing good image clarity and resolution in the nanometer range. HITACHI S 5200 has an electron accelerating voltage from 0.5kV to 200kV and a probe current range from 0.1nA to 2µA, allowing for high resolution imaging. It also has a range of detector units, such as CCD and SPAD cameras, for superior image capture. In addition, S-5200 has a high resolution digital image recording tool that captures and stores high-definition images. Moreover, S 5200 comes with a range of accessories and add-ons, such as sample holders, ion column, image analysis systems, stage holders and a micrometer stage drive asset. These accessories and add-ons can be used to extend the capabilities of the microscope and provide a more in-depth view of samples. HITACHI S-5200 is a powerful and versatile microscope, and is suitable for a variety of scanning electron microscopy applications, such as semiconductor failure analysis and material science. It provides superior image quality at high resolution and is perfect for precise, detailed work.
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