Used HITACHI S-5200 #9265145 for sale

HITACHI S-5200 is a scanning electron microscope (SEM) that offers precise imaging capabilities of specimens down to the nanometre size range. It utilizes a novel lensless SEM equipment that eliminates the usage of lenses, which allows capturing sample features with increased accuracy and accuracy. HITACHI S 5200 utilizes a microchannel plate (MCP) detector that is best suited for high speed imaging. This immensely increases the speed of image acquisition in comparison to conventional SEM systems, resulting in faster operation and improved productivity. S-5200 allows users to capture images in either manual or automatic mode. The manual mode feature allows users to set the working distance of the microscope. This convenient feature allows users to adjust the distance between the specimen and the detector, offering marvellous flexibility for sample studies. Moreover, S 5200 also features an automated image focusing system that adjusts the focusing level of the images automatically, resulting in a long-term efficient image acquisition process. HITACHI S-5200 is equipped with a wide selection of magnification levels (up to x803,000) and resolution levels (down to 2 nm). Its high resolution features a detector of 2048 x 2048 pixels, allowing user to capture the fine details of nanostructures efficiently and clearly. Its noise rejection capability allows for a noise-free image capture process. HITACHI S 5200 also features an innovative directed ion beam (DIB) unit, which enables precise microsurgery of the specimen with high spatial resolution. Equipped with the highly sensitive x-ray detector, S-5200 allows users to perform high resolution energy-dispersive spectroscopic (EDS) elemental analysis. This innovative feature allows S 5200 to identify the composition of stored samples with the extremely high accuracy and sensitivity, thereby enabling users to explore the composition of nanostructures down to the atomic level. HITACHI S-5200 also comes with an optional low volatility energy stage machine, which allows users to adjust the samples position with low levels of contamination. This also allows for precise imaging capabilities of particles with different shapes. In conclusion, HITACHI S 5200 has a variety of features that enable users to explore and study the nanostructures with unprecedented accuracy and detail. It also features a wide selection of magnification and resolution levels, low contamination stage, and an impressive X-ray EDS detector for elemental analysis, allowing users to explore the composition of samples with ever-increasing accuracy.