Used HITACHI S-5200 #9281957 for sale

HITACHI S-5200 scanning electron microscope (SEM) is a versatile instrument perfect for a variety of applications. It is designed to provide high resolution images and detailed analysis of a wide range of surfaces. With advanced features and an impressive range of capabilities, HITACHI S 5200 can meet the needs of a multitude of inspection and analysis requirements. S-5200 has two independent variable pressure chambers, enabling it to accommodate both conventional as well as low-vacuum requirements. It is able to work with very delicate samples, and can maintain absolute pressure at a minimum of 1x10-5 Pa. The maximum pressure achievable varies depending on the attached vacuum pump, up to the maximum of 10-3 Pa. Additionally, the microscope features a field emission scanning electron source with a filament resolution of 0.2nm. This means that it can provide excellent detail of even the finest surface structures. High acceleration voltage also enables increased penetration depth, making it much easier to carry out detailed analysis of hidden features and subsurface defects. S 5200 is extremely easy to operate. Featuring a tiltable low angle stage for in-situ imaging and very precise manipulations, the microscope can work with a variety of sample sizes. It can work stably up to a tilt angle of 30° and can also handle sample sizes with a minimum diameter of 1mm. HITACHI S-5200 also comes with a range of accessories that make it even more versatile and easy to use. This includes a pulsed particle detector, a variable pressure transfer system, a variable focus button, and a convenient touch panel. All of these features make HITACHI S 5200 a powerful and accurate tool for performing a variety of research tests, analyses, and inspections. Overall, S-5200 is an extremely reliable scanning electron microscope regardless of the task at hand. Its range of features, adjustable capabilities, and easy-to-use display make it the perfect tool for a variety of different surfaces and applications.