Used HITACHI S-5200 #9293887 for sale

HITACHI S-5200
ID: 9293887
Wafer Size: 8"
Vintage: 2001
Field Emission Scanning Electron Microscope (FE-SEM), 8" 2001 vintage.
HITACHI S-5200 Scanning Electron Microscope (SEM) provides advanced imaging capabilities. It is a variable pressure, fully automated equipment that is equipped with a large field of view and an efficient collection of image data. The system is designed to allow the user to quickly and easily access valuable information. The unit consists of a single-column SEM which combines a powerful electron gun and electron optics with time-of-flight mass spectrometry to produce high-resolution images of samples. The user has the option of selecting a magnification range between 50x and 500,000x, facilitating examination of large areas and sub micron structures. The machine also includes integrated auto-focusing, stage navigation, sample alignment, and operation via easy-to-use software. It has a full range of imaging options, including compositional and structural information such as homogenous or preferential thickness of samples. The tool also offers elemental analysis with an Energy Dispersion Spectrometer (EDS) to give an accurate and detailed description of a sample's composition. The asset can be outfitted with a variety of detectors, which allow for high speed imaging and easier manipulation. The detectors control the collection of secondary electrons, reflected electrons, backscattered electrons, and X-rays. This gives the user a complete look at the composition of a sample. The high-performance hardware also gives the user a wide range of scanning speeds, from low-KV to high-KV, and varying speeds at any magnification. This allows the user to quickly operate the microscope without the need to wait for long stabilisation times. HITACHI S 5200 is an advanced imaging model which offers unparalleled imaging performance. It delivers a full range of imaging capabilities to the user, including compositional and structural information, plus elemental analysis. Its integrated auto-focusing and varied speeds make it easier to manipulate and image the specimens. Lastly, its detectors give the user complete control of the imaging process.
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