Used HITACHI S-5200 #9309409 for sale

HITACHI S-5200 scanning electron microscope (SEM) is a high-resolution imaging instrument designed for the analysis of physical and electrical properties of semiconductor and other materials. With its advanced field emission technology and larger than usual stage area, this model is specifically suited for failure analysis, 3D X-ray imaging, and defect inspection. HITACHI S 5200 is capable of working at a wide range of temperatures and dust-proof conditions to accommodate various substrates and sample sizes. Its excellent resolution, combined with its high speed of scanning and 5KV-30KV variable-accelerated voltage, makes it suitable for rapid characterization and analysis of samples down to the nanometer scale. S-5200 is an essential tool for determining sample characteristics such as morphology, composition, and distribution patterns. The wide range of built-in modes for contrast and resolution enhancement facilitate capturing dimensionally accurate images and spectra that reveal information about the sample's physical and electrical properties. S 5200 is equipped with a Hybrid Detector System (HDS) that gives users unprecedented control over the image brightness and contrast. It also features dedicated software for planning and executing experiments so users can adjust the parameters of their experiment for optimum performance without any manual intervention. In addition to the optical microscope, HITACHI S-5200 also includes an Image Education and Analysis (IEA) program to facilitate data capture and analysis. With its adjustable resolution and sensitivity settings, users can identify various features in their samples and quantify them with accurate precision that is consistent across images. HITACHI S 5200 supports a variety of automated features to further facilitate the acquisition and processing of images. This includes automatic centering, automatic stitching, and automatic focus. Furthermore, the large field of view, paired with its high-resolution capabilities, enables users to image large areas of the sample with clarity and detail. Overall, S-5200 scanning electron microscope is a powerful tool for characterizing and analyzing a variety of samples with accuracy and precision. Its versatile features and high-intensity imaging capabilities allow users to explore the nanoscale details of their samples with confidence.