Used HITACHI S-5200 #9377259 for sale

HITACHI S-5200
ID: 9377259
Vintage: 2005
Field Emission Scanning Electron Microscope (FE-SEM) With magnetic canceller 2005 vintage.
HITACHI S-5200 is a scanning electron microscope (SEM) that combines advanced imaging capabilities with the robust sample environment typically found in research grade microscopes. The instrument offers a high performance imaging equipment for the visualization of nanoscale features with excellent spatial resolution and contrast. HITACHI S 5200 features a high-resolution CCD camera, high-efficiency electron source, and a column designed for a broad range of imaging applications. S-5200's precision column is equipped with an energy dispersive X-ray detector (EDS) for routine imaging and elemental analysis, and a full range of manipulators and sample stages for ultra-high accuracy sample positioning. In addition, the system includes several operating modes, including secondary electron imaging, backscattered electron imaging, and highly specialized imaging modes, such as tilt-correction SEM and three-dimensional imaging. S 5200 is ideal as a parallel imaging unit for routine life science, nanotechnology, and materials science applications. Image detail achieved in HITACHI S-5200 is unrivaled and the instrument's high vacuum compatibility enables the operation of samples over a wide range of pressure and temperature without the need for a cryo-vacuum machine. The tool is equipped with a variety of sample mount options including a non-contact mount for fragile specimens, a low-temperature stage for biological and organic samples, and a range of specialized sample preparation tools including a gas injection asset and a dual stage ion gun. HITACHI S 5200 is a powerful SEM model designed for heavy-duty research, providing a versatile platform for a wide range of materials research applications. The instrument is capable of producing a full range of images, from large-scale imaging to nanoscale fine imaging. This equipment allows researchers to visualize the topography, shape, texture, composition, and morphology of a wide variety of samples. The combination of excellent imaging capabilities and variable vacuum and sample staging features provides a powerful platform for materials research.
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