Used HITACHI S-5500 #293589666 for sale
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HITACHI S-5500 is a dedicated scanning electron microscope (SEM) designed for a variety of materials science applications. It features a high-speed secondary electron detector, a dual backscatter detector, and a new autofocus equipment that enables researchers to capture high-resolution images. HITACHI S 5500's high-speed secondary electron detector is capable of producing fast scan images at a high resolution of 1nm. This enables researchers to visualize fine details in their samples such as grain boundaries, facets and other surface features. The secondary electron detector increases the sensitivity of the system by up to 1000 times compared to standard detectors. S-5500 also features a dual backscatter detector capable of simultaneously capturing both secondary and backscatter electrons. This allows users to generate compositional data from their samples and observe the physical and chemical properties of their specimen. The backscatter detector is equipped with an energy-filtering unit which helps to obtain detailed information about the elemental composition of the sample. S 5500 has also been fitted with a new autofocus machine. This tool helps to maintain the sharpness and clarity of images by automatically correcting any focusing issues that arise. This asset is especially useful for scanning specimens with uneven surfaces such as soils and powders. Finally, HITACHI S-5500 boasts an enhanced observation mode. This newly developed feature includes an autoimage stabilization model and a noise reduction equipment. These technologies help to improve the accuracy of images by reducing the noise level and optimizing the brightness and contrast of the images. HITACHI S 5500 is a versatile Scanning Electron Microscope (SEM) system that is suitable for many materials science applications. It features a high-speed secondary electron detector, a dual backscatter detector, a new autofocus unit, and an enhanced observation mode. All of these features combine to make S-5500 a powerful imaging tool that can provide detailed information about the physical and chemical properties of a variety of materials.
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