Used HITACHI S-5500 #9194484 for sale
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ID: 9194484
Vintage: 2009
Scanning electron microscope (SEM)
Secondary electron image resolution:
0.4 nm (30 kV, Sample height = 1.0 mm)
1.6 nm (1 kV, Sample height = 2.0 mm)
Accelerating voltage: 0.5 - 30kV
Magnification:
LM Mode: 60 - 10000x
HM Mode: 800 - 2000000x
Electron optics:
Electron gun: Cold cathode field emission electron source
Lens system: 3-Stage electromagnetic lens reduction system
Objective lens: Variable type
Stigmator coil: Octopole electromagnetic system
Scanning coil:
HM Mode: 2-Stage electromagnetic deflection
LM Mode: 1-Stage electromagnetic deflection
Beam blanking:
Electrostatic type: Synchronized with scanning coil
Electromagnetic type: Image freezing
Specimen stage:
Stage: Side-entry goniometer stage
Stage traverse:
X: ±3.5 mm
Y: ±2.0 mm
Z: ±0.3 mm
T: ±40°
Sample Size:
Bulk: 5.0 mm x 9.5 mm x 35 mmH (max)
Cross-section: 2.0 mm x 6.0 mm x 5.0 mmH (max)
Electrical image shift: ±5 ~m (Sample height=0 mm)
Detectors (Options):
Secondary electron detector
Upper backscattered electron detector
YAG Backscattered electron detector
BFIDF Duo-STEM detector
STEM Detector
Faraday cup
Energy dispersive X-ray detector
Display system
PC: Windows desktop PC
OS: Microsoft windows XP Professional
Monitor: 19 type LCD
Image display mode:
Full screen display: 1,280 x 960 pixels
Reduced area display: 640 x 480 pixels
Reduced area display: 320 x 240 pixels
Dual image display: 640 x 480 pixels x 2
Evacuation system
Auto evacuation:
Fully automatic pneumatic valve
Control system
Ultimate vacuum:
Electron gun chamber: <1 x 10^7 Pa
Specimen chamber: <7 x 10^5 Pa
Vacuum pumps:
Ion pump: 70 l/s x 1
Ion pump: 30 l/s x 1
Turbo molecular pump: 260 l/s x 1
Scroll type dry pump: x 1
Utility requirements:
Room temperature: 15 ~ 25°C
Humidity: 60% RH or less
Power: Single phase, ACIOO-240V ±10%, 4 kVA
Grounding: 100 ohms or less
Cooling water:
Flow: 0.6 - 1.0 l/min
Pressure: 50 - 100 kPa
Temperature: 10 - 20°C
Supply faucet: Rc 3/8 tapered female thread x 1
Drain port:
20 mm Diameter
Natural drain located on floor
2009 vintage.
HITACHI S-5500 Scanning Electron Microscope is a state-of-the-art SEM designed for high-resolution imaging and analysis. Its advanced features make it an ideal option for a wide range of imaging and analysis including life science, materials science, and environmental analysis. HITACHI S 5500 has a hybrid scan equipment with both secondary and back-scattered electron detectors, as well as four electron entry ports. It also features a state-of-the-art electron optical system with a variable pressure chamber, enabling operation from vacuum to high air pressures. The optical unit was designed to minimize aberrations, resulting in a high performance 5 nm resolution in secondary electron imaging and 3 nm resolution in backscatter imaging. S-5500 is optimized for observation and analysis of biological and high-resolution imaging of soft materials. The microscope's environmental chamber is particularly useful for the observation of cell cultures, allowing for observation of delicate material, in a variety of scanning modes, such as low contrast imaging, drying indices, and variable pressure imaging. S 5500 also includes an onboard ion-blasting/deposition machine, which can be used for precise sample preparation and observation. The tool is able to generate high-precision imaging results, with sharp and fine detail, through its ability to deposit materials onto the sample surface. Immersive 3D microscopy is also possible with HITACHI S-5500 through the utilization of a unique STED imaging function. This allows for various imaging techniques such as single-molecule fluorescence imaging, nanometre-scale imaging, and three-dimensional tomography. HITACHI S 5500 is also capable of producing high quality scanning electron diffraction patterns, with an integrated EBSD detector. The resulting patterns can then be used to resolve crystal structures and predict properties such as elastic modulus, relative hardness, and defect concentration. Therefore, S-5500 is an ideal instrument for the analysis of nanostructure and material properties. S 5500 also features a wide-field imaging asset, capable of producing clear, high resolution images with low noise. This makes it an ideal choice for the observation of large specimens where detail is of the utmost importance. Overall, HITACHI S-5500 Scanning Electron Microscope greatly expands the capabilities and applications of microscope technology, allowing for the analysis of samples on an atomic level. Its unique combination of performance enhancing features makes it an ideal choice for many fields of science and industry.
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