Used HITACHI S-5500 #9243639 for sale

HITACHI S-5500
ID: 9243639
Wafer Size: 12"
Vintage: 2006
Scanning Electron Microscope (SEM). 12" 2006 vintage.
HITACHI S-5500 Scanning Electron Microscope (SEM) from HITACHI High Technologies America provides high resolution imaging and analysis capabilities for a wide range of samples and applications. HITACHI S 5500 offers superior image quality, with excellent performance for both Low Vacuum (LV) and High Vacuum (HV) imaging. S-5500 features a unique inclusion chamber, which provides a clean, contaminant-free environment for the user, ensuring superb image quality in addition to superior endurance. S 5500 utilizes a sophisticated five-stage primary electron column, which allows for high resolution imaging over a wide range of accelerating voltages from 5 kV - 30 kV, with an impressive range of depths ranging from 0.1 nanometre to 8 micrometres. Electron lenses are finely adjustable for optimized imaging performance, with an impressive two-dimentional imaging accuracy of 0.3nm without any degradation of image quality. This performance is assisted by the in-column phase contrast enhancement technology, which eliminates any image fuzziness from vacuum related problems and increases image contrast resolution. HITACHI S-5500 also includes a wide range of auto-measurement functions, such as particle size measurement, length measurement, area determination, circle measurement, and angle determination. Additionally, quantitative measurment capabilities are included with the automated feature detection equipment, which is capable of identifying different types of particles and measuring their parameters. This comprehensive cability set is supported by the system's fast data processing capabilities, allowing for rapid sample analysis. HITACHI S 5500 also includes a low noise measurement unit for increased accuracy, as well as several environmental scanning functions that significantly reduce the time required for sample analysis. Additionally, low electron energies can be used during the analysis session to reduce sample damage for fragile samples, and a range of high vacuum conditions ensure minimal sample damage during long term use. Overall, S-5500 Scanning Electron Microscope is a high-end machine, designed for a wide range of applications across the scientific field. With excellent image quality, sophisticated measurement, and environmental scanning capability, S 5500 provides superior performance in a variety of imaging and analysis tasks. The inclusion chamber ensures a contaminant-free environment with long term endurance, further illustrating the advanced capabilities of HITACHI S-5500.
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