Used HITACHI S-570 #134826 for sale

HITACHI S-570 Scanning Electron Microscope (SEM) is a fully featured, integrated imaging solution. HITACHI S 570 utilizes a high-performance electron column and digital controller that enable a range of imaging modes such as high-resolution secondary electrons, backscattered electrons, and the ability to capture a range of ion signals. This versatile SEM is designed for use in both research and industrial applications, and is capable of generating high resolution images of uncompromising quality. S-570 is equipped with an ultra-high-performance MSD (Multi-Step Detector) that provides a maximum resolution of 2.0nm. This superior resolution allows for the discerning of structural details and the identification of surface structures. In addition, the high voltage power supply is capable of producing a range of high voltage levels from 30kV to 30 MV, providing excellent contrast for efficient imaging. S 570 is also equipped with a dual-stage automation system that allows for simultaneous adjustment of acceleration voltage, spot size and brightness. This allows for enhanced flexibility in the examination of specimens, with well-defined areas of interest illuminated in an ideal fashion while also maintaining overall image stability. The integrated digital imaging system includes LCD display, image analysis and image processing features. Features such as Auto Size Zoom and Auto Frame Stabilizer provide unique ease of use. In addition, an Image Capture Mode allows for image transfer to a variety of destinations, including USB flash drives and digital cameras. HITACHI S-570 can be paired with a range of ancillary accessories, including specimen holders, EDS detectors and microanalyzers, X-ray detectors, dual detectors for both SEM scanning and EDX analysis. This instrument also provides a Pulse Count Detection system which allows for different X-ray signals to be detected simultaneously. HITACHI S 570 also comes with a range of specialized software which enables users to produce detailed analyses of their specimens. These software applications include CADRA for the design and production of 3D alignments and profiles, and PartFinder for computer aided part identification. Finally, this superior SEM is backed by an after sales service and support solution that provides engineers and technicians with comprehensive help, advice and support. In short, S-570 is an advanced, fully integrated scanning electron microscope that features exceptional image quality, dual-stage automation and superior digital imaging capabilities. With its revolutionary MSD detector, high resolution capability and range of ancillary accessories, S 570 will provide researchers and engineers with excellent performance, flexibility and reliability.