Used HITACHI S-570 #177900 for sale

HITACHI S-570 is a scanning electron microscope (SEM) designed for both high resolution imaging and quantitative analysis of a wide variety of samples. The equipment is characterized by excellent image quality and high throughput performance, allowing for quicker sample analysis. The instrument's main components consist of an electron gun, a condenser column, an electron detector, a high tension power supply, and sophisticated software controls. An electron gun generates electrons which are focused onto the sample by the condenser column. These focused electrons interact with the sample, producing secondary electrons and x-rays that are then detected by the detector. As the detector acquires data from the sample, the software controlled by the user first processes and displays the resulting image, then allows adjustment of imaging parameters or further data analysis. The system's full field high performance type detection technology allows for low noise images with an enhanced photoelectron signal. Features such as this, as well as the unit's energy filter, rotatable stage and intelligent focusing assist, provide excellent resolution with no slow down in imaging speed. The detected signal strength is further improved with the use of EverHalo, a new feature for HITACHI S 570, based on a patent-pending contrast control technology, that utilizes a hyper contrast detection process and digital image processing to improve image fidelity. This helps to provide clear, contrasty images with greater accuracy, while concurrently preventing chromatic aberration due to detection geometry, enabling observing objects with outstanding contrast. In addition to this, S-570's advanced software suite allows for quantitative analysis. From electron energy loss spectroscopy (EELS) to electron backscattering diffraction (EBSD), the machine enables the user to quickly and easily measure a wide range of variables, aiding in sample characterization. As the highest level of performance is expected from the tool, the automated wafer clean and stage cleaning systems allow for reliable experiment repetition and repeatable performance. S 570 scanning electron microscope is thus a powerful, versatile instrument that provides high resolution imaging and quantitative analysis capabilities in a user friendly package. This enables researchers to quickly and efficiently gain a better understanding of their samples, furthering their research goals.