Used HITACHI S-570 #293592480 for sale

ID: 293592480
Scanning Electron Microscope (SEM) Resolution: 2.5 nm Magnification: 20 to 100,000x, 12-100,000x Filament: Pre-centered LaB6 Maximum beam current: 300 µA Auto bias Alignment: 2-Stage electromagnetic alignment Lens: 3-Stage electromagnetic lenses Stigmator coil: Electromagnetic type Scanning coil: 2-Stage electromagnetic type Objective: Movable aperture Maximum specimen size: 150 mm Specimen stub size: 6 mm Ultra high resolution: 50 mm Specimen exchange: Air leak Motion range (Large stages): X: 0-40 mm, 0-100 mm Y: 0-40 mm, 0-50 mm Z: 5-35 mm, 20-60 mm Tilt: -20°-+90°, 0°-60° Rotation: 360° Power supply: 0.5-3 kV, 100 V / 3-30 kV, 1 kV.
HITACHI S-570 scanning electron microscope (SEM) offers outstanding performance and advanced features to support wide-ranging material science research applications. HITACHI S 570 offers the highest resolution available in its class, providing a resolution of 1.2 nm at 30 mm working distance, and a resolution down to 0.8 nm at a 6 mm working distance. This capability enables the imaging of individual atoms and molecules, and allows for the study and characterization of new materials and nanostructures. S-570 scanning electron microscope also offers a diverse range of detector configurations. These include secondary electron detectors, backscattered electron detectors, as well as a variety of sample-taking systems including EDX, EBSD, and SDD detectors. As a result, S 570 is well suited for multidisciplinary applications, from imaging and analysis of nanomaterials to life sciences research. HITACHI S-570 benefits from an advanced electron optics column design. This includes advanced contamination control, which is key for achieving the high levels of imaging resolution. Moreover, the mechanical design of the column ensures that the SEM remains in a perfectly stable position during operation, with no drifting or vibrations, which are essential for SEM applications that require high levels of accuracy. HITACHI S 570 is designed to be a flexible and user-friendly instrument. Its features include image analysis capabilities, 4 electron gun configurations and programmable magnification control, which allows for high productivity in both routine and advanced SEM imaging applications. It also includes advanced user controlled drift correction. This is important for accurately and rapidly acquiring images, hence reducing the amount of time required for a scan. S-570 is fully compatible with a range of automation and motion control systems, allowing for quick and easy setups of complex SEM imaging tasks. Moreover, an open platform allows for easy integration with a wide variety of imaging systems and automation software, which enhances the range of available imaging applications. Finally, S 570 is designed to deliver outstanding performance at a competitive price. This makes HITACHI S-570 an ideal choice for any material science application requiring high resolution imaging and analysis.
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