Used HITACHI S-6100 #9144954 for sale

HITACHI S-6100 is an advanced scanning electron microscope (SEM) that is designed to provide high resolution images of the interior of materials and structures. It utilizes electron optics, an electron beam, a detector and an X-ray detector to create its visuals. In addition, it has a sample stage with motorized controls of X/Y/Z and tilt, allowing for precise manipulation and adjustment of the sample for better imaging. The primary components of HITACHI S 6100 include the electron gun, the electron lenses, the electron detector, and the X-ray detector. The electron gun provides electrons that are accelerated and focused through the electron lenses, allowing for images to be created at different magnifications. The electron detector allows the user to view the image on a display as it is being generated along with an indication of the magnification being used. The X-ray detector provides X-ray spectra of the sample, allowing the user to analyze elemental content and distribution with greater precision. S-6100 is capable of providing high resolution, 3D images of morphology, surface features, and internal features. Its imaging capabilities are further enhanced with its secondary electron imaging (SEI) and backscattered electron imaging (BEI) modes. With SEI, the user can see a surface view of the sample and with BEI, the user can see the surface and internal features. S 6100 also has an automated stage which can be pre-programmed to carry out simple routines such as a systematic scanned area, stereo imaging, tilted imaging, or mosaicking, allowing for the imaging of larger sample areas with finer resolution. In addition, the tilt stage allows for greater adjustability and manipulation of the sample with the ability to tilt in several angles and rotations. Finally, HITACHI S-6100 has an advanced analysis suite which includes X-ray microanalysis, electron backscattered diffraction (EBSD), and automated hyper-volume mapping (AHVM). This allows the user to analyze not just the surface topography, but also the internal structure, composition and crystallographic orientation of the sample. HITACHI S 6100 is a high-performance SEM that offers advanced imaging and analysis capabilities. Its sophisticated design allows for increased resolution, better imaging, and enhanced analytical abilities, allowing for more detailed analysis of samples. By utilizing its advanced imaging and analysis features, the user will be able to extract more detailed information from solid materials to better understand their structure and properties.