Used HITACHI S-6280H #293642210 for sale

HITACHI S-6280H Scanning Electron Microscope (SEM) is a powerful imaging tool that can be used for a variety of imaging applications. The instrument's high performance, versatility and flexibility make it ideal for research and industrial applications. It features a high magnification range, allowing for imaging of features down to sub-nanometer resolutions. The microscope is equipped with a large, multi-channel energy dispersive spectrometer for X-ray (EDS) elemental mapping and a secondary electron detector suitable for imaging magnetic domains on steel samples. The column and sample chamber of HITACHI S-6280 H are temperature stable and isolated from temperature fluctuations, enabling the instrument to remain at a constant temperature, which is crucial for stable operation and accurate results. The column also has increased stability and stiffness which results in higher resolution images and better performance. The ultra-high vacuum has a pumping speed of two liters per second. The adjustable column current allows you to adjust the instrument to provide optimal imaging either with low currents (low kV) or high currents (high kV). The objective lens holder of S-6280H SEM is equipped with a wide range of objective lenses, including 3x, 5x, 10x, and 20x, with corresponding maximum field of view. The magnification range for the instrument is 20x to 500,000x, and the working distance range is from 5mm to 50mm. The SEM also features an aperture current control which can be used to adjust the size of the beam used for imaging samples. The instrument is designed to combine the benefits of both a SEM and an optical microscope, allowing for sample viewing from both an electron beam and a light source. It is equipped with a tiltable modular sample holder that can be used for viewing samples from different angles. The sample holder is also equipped with an integrated gas inlet, allowing for controlled sample etching during imaging. In order to get the best images, S-6280 H SEM also offers innovative imaging techniques, such as EDS mapping, which can be used to create accurate images of elemental distributions within samples. Additionally, the microscope can be used for tomography, which creates 3D images of samples in maximum resolution. Overall, HITACHI S-6280H SEM is a powerful and versatile imaging instrument that combines the benefits of both SEM and optical microscopes. Its large range of magnifications, adjustable column current and advanced imaging techniques make it suitable for a variety of research and industrial applications. The instrument is robust, accurate and can be used to create high-resolution images of samples at the nano-scale.