Used HITACHI S-6280H #9145527 for sale

HITACHI S-6280H is a high-performance scanning electron microscope (SEM) with an impressive suite of features. It is equipped with an inbuilt deflection coil equipment as well as a pre-scan imaging system, both of which allow for greater flexibility in image acquisition, high speed imaging, and ease of operation. The pre-scan imaging unit increases machine throughput, while the deflection coil tool allows for smaller field of view. The specimen chamber is outfitted with a stage that can rotate up to 360°. This feature allows for full 3D imaging without having to move the sample. HITACHI S-6280 H is equipped with an intuitive, user-friendly digital multifunction controller that allows for SEM operations including imaging, analytical measurements, and quantitative analysis. The controller contains a variety of functions and settings, making it a powerful tool for advanced microscopy research. S-6280H is designed with a cold-field emission type electron source known as a Schottky field emitter. This emitter has been optimized to provide a low-flux, high-resolution imaging performance, and has energy resolving capabilities that surpass traditional thermionic emission sources. Its high source performance, coupled with low sample drift, allows for higher resolution imaging over larger areas. S-6280 H is constructed with an integrated automated specimen loading asset for reducing the amount of manual interaction required. The auto-loader has a 2-position specimen exchange chamber which enables easy switching between samples, while the automatic load/unload functions allow for quick transition between experiments. Finally, HITACHI S-6280H also features imaging and analytical capabilities. The model is designed with an adjustable, multi-beam scanning electron source that allows for variable beam intensities and can image beyond the resolution limits of conventional SEMs. The impressive range of imaging modes allow researchers to perform multiple types of imaging techniques, including backscatter imaging, secondary electron imaging, and in-lens imaging. HITACHI S-6280 H is also capable of quantitative analysis in conjunction with an Oxford Instruments Energy Dispersive Spectrometer equipment for elemental analysis. All in all, S-6280H is an advanced scanning electron microscope designed to provide ease of operation, fast imaging, and powerful research capabilities. Its high performance features and advanced capabilities make it an ideal solution for advanced microscopic imaging, analytical measurements, and elemental analysis.