Used HITACHI S-6280H #9359435 for sale

HITACHI S-6280H is a scanning electron microscope (SEM) that is ideal for a wide range of applications in materials science, Failure Analysis, Life Science, Environmental Sample Analysis and semiconductor devices. It provides ultra-high resolution images by using a unique combination of technology, high-quality optics and superbly engineered control systems. HITACHI S-6280 H features a large field of view with a wide variety of detector and lens configurations. This allows for detailed observations with easy visual identification of rich sample information. Its advanced features include a multiple-column (multi-column) dual energy detector system, providing superior image contrast of surface information. It also includes a variable pressure system, allowing for operations at both low vacuum and high vacuum conditions. S-6280H further features an extremely fast image capture time of 200 microseconds and high resolution capability of 15 nm (15 nanometers) for special diagnostics at high magnifications. A high-powered video-processing technology enables the fast detection and identification of minute sample surface features. Its large specimen chamber offers ergonomic operation for easy specimen operation and stage movement. The integrated electronics provide fine control over magnification, beam current, and signal detection. It can handle specimen sizes up to 100 mm (one hundred millimeters) in diameter and is suitable for demanding high-throughput operations. S-6280 H has a high-sensitivity, low-noise digital image detector to maximize image contrast and reduce noise. It utilizes a high-sensitivity photometric system to adjust video frequency gain for the capture of clear, light-sensitive images. It has a wide variety of software functionality, enabling users to customize controls or use preset modes for optimized performance and results. HITACHI S-6280H includes a wide array of advanced technologies such as ultra-high resolution focus mechanism, advanced electronic components, ion source capability, and numerous automated built-in features. It can be combined with an advanced high-resolution STEM (Scanning Transmission Electron Microscopy) to achieve even further superior resolution and imaging capability. Overall, HITACHI S-6280 H offer powerful features and superior performance for materials analysis and specimen observation. Its high-quality optics and advanced electronic components showcasing the best in imaging/resolution specifications, giving higher resolution images at shorter exposure times. In combination with its numerous facilitation features and ergonomic design, this makes S-6280H an ideal choice for a variety of laboratory environments.