Used HITACHI S-7000 #9282901 for sale
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ID: 9282901
Wafer Size: 4"-6"
Vintage: 1989
Critical Dimension Scanning Electron Microscope (CD-SEM), 4"-6"
Secondary electron image resolution: 15 nm (150 angstroms) at 1 kV
Magnification: 100x to 100,000x
CD Measurement Range: 15 Å (15 nm)
Re-producibility: ± 0.02 µm / ±1%
Electron beam source: Field emission electron gun
Accelerating voltage: 0.7-3 kV (100 V/Step)
Measurement range: 0.1- 200 µm
Auto-focus and auto-stigmation
Automated CD measurement
Multi point measurement capability
Programmable stage: Up to 60° Tilt
1989 vintage.
HITACHI S-7000 scanning electron microscope (SEM) is a versatile and powerful imaging tool for scientists and engineers. It has the ability to achieve resolutions of three nanometers and magnifications up to 100,000 times. S-7000 SEM offers high speed image acquisition and a wide range of imaging capabilities. HITACHI S-7000 produces images by taking advantage of the interactions between the electrons and the target material being viewed. The incident electrons travel through a series of lenses before they interact with the sample. The interaction creates a series of secondary electrons and backscattered electrons that can be used to create an image of the sample. With its scanning system, S-7000 allows users to survey large surface areas, or closely look at fine details. HITACHI S-7000 includes both manual and computer-controlled sample manipulators. This allows users to easily move, rotate, and tilt the sample in the detector field of view. A selection of lenses allow users to choose the optimal imaging settings for their application. S-7000 SEM is equipped with an advanced Quantitative Image Analysis system, allowing users to more accurately measure the size and shape of samples. This feature makes HITACHI S-7000 particularly suited for morphological studies and measurements. S-7000 SEM also has a series of high performance detectors available, allowing users to capture X-ray, EDS, EELS, CL and BSE images as required. The SEM includes a stage for sample mounting as well as an in-situ vacuum chamber that can be easily removed and replaced. Overall HITACHI S-7000 is an excellent choice for any research project or setting in need of a highly reliable, precise, and versatile scanning electron microscope. With its high resolution imaging, advanced imaging capabilities, and a wide range of quantitative imaging analysis features, S-7000 is an ideal choice for scientists and engineers of any background.
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