Used HITACHI S-7800 #293664979 for sale

HITACHI S-7800 Scanning Electron Microscope (SEM) is a high performance, high resolution imaging system designed to produce highly detailed images of small objects. It is widely used in industrial research and development, quality control, and manufacturing. S-7800's electron optics are designed to provide high resolution images of small objects in both 2D and 3D configurations. The system contains an electron column, consisting of a gun lens assembly, detector assembly, objective lens and specimen stages. The electron gun assembly is a thermionic electron gun, which produces electrons with a wide range of energies from 10 to 30 kV. The gun is mounted to a column with three linear stages, X-Y-Z, which are used to move the gun about a sample for focus and magnification. A source collector is used to collect particles produced by ionization of molecules in the specimen. The optical column contains an objective lens and six detectors, a backscatter detector, secondary electrons detector, reflected electrons detector, stereo detector, cathodoluminescent detector, and an image scanner detector. In the optical column, the objective lens is used to magnify images for more detailed observation. All the detectors, along with the image scanner, provide data such as light scattering, secondary and reflected electrons, luminescence, and stereo 3D images. The specimen stage is used to position the sample prior to imaging and includes features such as X-Y stage travel of up to 200mm, sample tilt up to 90 degrees, and a vacuum port. The stage can also accommodate small objects or thin samples, such as transistors, integrated circuits, and carbon nanotubes with a minimum lateral dimension of 30 nanometers. The SEM's image processing software allows the user to analyze, store, and save images in a wide variety of file formats. It is capable of performing a wide variety of imaging functions such as edge detection, contrast enhancement, and pseudo-coloring. The software also provides features to control the microscope's electron current, acceleration voltage, and magnification. This allows users to adjust microscopy parameters to obtain the required level of detail or contrast. Overall, HITACHI S-7800 Scanning Electron Microscope provides users with the high-resolution imaging and analysis capabilities necessary for a variety of industrial research and development applications. With its powerful electron optics, highly sensitive detectors, and advanced image processing capabilities, S-7800 is an excellent choice for scientists and engineers looking to perform high-quality imaging and analysis.