Used HITACHI S-7800 #61575 for sale

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ID: 61575
Wafer Size: 6"-8"
Cold field emission scanning electron microscope, 6"-8" Resolution: 5nm SE Detector: Through the lens type Magnification: 150,000x Accelerating voltage: 0.5 kV - 15 kV Measuring range: 0.1mm - 10mm Measurement repeatability: 15nm at 3 sigma Stage: 5-axis CPU controlled X, Y: 0-200mm Z: 4, 7, 12 mm T: 0-30°, R: 360° Stage positioning accuracy: 10 um Wafer handling: Cassette to cassette Vacuum system: Rotary, turbo and ion pumps Evac control: Automatic Pattern recognition: standard Measurement: Menu driven Interface with defect inspection system EDX.
HITACHI S-7800 scanning electron microscope (SEM) is a powerful research instrument used in a wide range of scientific and industrial applications. This type of electron microscope uses a focused beam of electrons to image a sample and achieve magnifications up to 100,000 times that of the naked eye. This allows researchers to observe the fine details of a sample that are invisible to the human eye. S-7800 is capable of ultra-high-resolution imaging of small features on samples. It features high voltage settings up to 30 kV, allowing users to acquire detailed images of even the smallest atomic level features on the sample. HITACHI S-7800 also features an integrated Energy Dispersive X-Ray spectroscopy (EDX) unit, used to analyze the elemental composition of the sample. This provides valuable data beyond the visually observable features. S-7800 can be equipped with an environmental chamber, which allows samples to be studied in a range of temperature and pressure conditions. This opens up a number of experimental possibilities, from studies of volatile compounds to investigations of how materials react to extreme conditions. HITACHI S-7800 also provides a range of imaging modes such as secondary electron imaging, scanning ion imaging, and wavelength dispersive spectroscopy. S-7800 is equipped with a software package that allows researchers to easily operate and optimize the microscope for their particular requirements. This includes controlling the beam for maximum resolution, setting up imaging parameters, and recording digital images for further analysis. In summary, HITACHI S-7800 is a powerful and versatile scanning electron microscope suitable for a wide range of applications. With its combination of high magnification capabilities and an EDX unit, it is ideally suited to studies of material structure and composition at the atomic level. It is also capable of accommodating samples in a range of environmental conditions, making it a valuable tool for physicists, chemists and materials scientists.
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