Used HITACHI S-7800 #9109894 for sale

HITACHI S-7800 is a scanning electron microscope (SEM). It offers superb imaging capabilities and extraordinary analytical performance. The SEM is equipped with an automated image augmented detection system, allowing for improved repeatability, high resolution imaging, data collection and analysis. S-7800's acceleration voltage is variable, and can operate up to 30kV allowing a wide range of sample materials to be examined and analysed with outstanding image quality and resolution. Additionally, the work of this SEM is complemented by a wide range of detectors and detectors systems, such as energy dispersive X-ray (EDX) spectroscopy, EBSD (electron backscatter diffraction) and EDS (energy dispersive spectroscopy). HITACHI S-7800 offers an impressive combination of features such as highly accurate image resolution, voltage stability and energy resolution. With its high throughput imaging capabilities, even the most complex sample structures can be viewed with utmost clarity. The manipulation of samples and data can be easily carried out with the help of multiple expandable computer graphic user interface software options. S-7800 has an integrated sample view system, which allows different stages of sample examination to be carried out at the same time. This allows a more efficient workflow and extended operation duration. The sample chamber is highly temperature and environmental controlled with a maximum pressure of 10-6 mbar enabling it to study a variety of specimen under a low vacuum. HITACHI S-7800 is also equipped with an image manipulation options, wherein the user is can adjust brightness, contrast, color or size of the preset images. The SEM is also capable of making precise measurements on 3D places of interest. It measures line width, surface area and perimeter of various cross-section studies. In addition to the host of features, its user-friendly software makes it one of the most advanced SEMs in the market. In conclusion, S-7800 allows for micro-analysis of a variety of materials with superior imaging, data collection, and analytical performance.