Used HITACHI S-7800H #293641909 for sale
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ID: 293641909
Wafer Size: 2"
Vintage: 1997
Scanning Electron Microscope (SEM), 2"
Main unit
(2) Controllers
(3) Power supplies
1997 vintage.
HITACHI S-7800H is a scanning electron microscope (SEM) designed for high-resolution imaging and characterization of a range of specimen types. It features an advanced single tilt detector column and scanning stages, providing a wide field of view and excellent image quality. The microscope's compact design and ergonomic features make it suitable for both laboratory and field use, while the cutting-edge imaging technology and software make it ideal for applications such as failure analysis, materials research, and metallurgic imaging. HITACHI S-7800 H's single tilt detector column is equipped with four different energy dispersion detectors: an imaging detector for secondary electrons (SEs), a backscattered electron detector for backscattered electrons (BSEs), a larger area detector for second and third-order diffraction (DDs) imaging, and a very high-counts spectrometer for EDS analysis. The imaging detector has a maximum resolution of 1.25 nm and a field of view of up to 5.0 mm. The backscattered electron detector has a resolution of 1.0 nm and a field of view of up to 10 mm. The larger area detector has a resolution of 2.5 nm and a field of view of up to 6.7 mm, with a maximum EDS count rate of 460,000 cps. S-7800H's scanning stages have a maximum velocity of 180 cm/s in X and Y directions, with a maximum travel range of 40 mm in X and Y coordinates. The stages are equipped with connection points for DA (differential array) signals and motor brakes, making them suitable for automated operation. The microscope's built-in digital imaging capabilities include specimen rotation up to 360° and positioning in X, Y and θ coordinates. User presets can be stored for relevant parameters and the analytical software offers an array of data analysis functions and advanced features. S-7800 H is a powerful and data-rich imaging system, designed to meet the needs of modern materials research, failure analysis and metallurgy. Its sophisticated features and technology enable users to image, analyze and conduct experiments with high levels of accuracy, resolution and detail.
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