Used HITACHI S-7800H #9249263 for sale

HITACHI S-7800H scanning electron microscope (SEM) is a high performance, high-sensitivity instrument which provides an array of unique features for various research and industrial applications. This versatile instrument offers a range of imaging and analytical techniques that can be tailored to a range of sample types while providing both high-resolution and high-throughput capabilities. HITACHI S-7800 H has been designed for providing exceptional resolving power while giving users high performance imaging and analytical capabilities. It is equipped with an advanced ultra-high vacuum (UHV) chamber which enables the observation and analysis of samples without requiring costly maintenance or specialized techniques. The equipment is also equipped with state of the art scanning technology as well as an integrated control system and built-in accuracy measurement features. Other features include: a dual detector design with a dedicated secondary electron detector, an Energy Dispersive Spectrometer (EDS) detector, and a back-scatter and gun current monitor. This design enables a wider range of applications for a greater amount of analytical information. The unit is also constructed with an electrons field emission gun which enables higher resolutions and performing higher quality imaging. An aptitude for a broad range of analysis is enabled with the wide selection of specimen holders that are provided for the machine. The sample stage is capable of several motion ranges, allowing for accurate positioning of specimens and automated maneuvering for analysis and imaging. The automated stage control tool also offers easy and accurate sample position. With its advanced imaging and analysis capabilities, S-7800H is an ideal instrument for a wide variety of applications. It is also equipped with an array of specialized software that are intuitive and easy to operate. These software package include 3D image reconstruction, analysis routines, overlay and montage software, as well as metrology and data acquisition software. In addition, the asset provides users with advanced connectivity options, enabling interaction with other instruments and data analysis platforms. In summary, S-7800 H scanning electron microscope is the ideal instrument for a range of research and industrial applications, providing its users with a unique array of powerful imaging and analytical features.