Used HITACHI S-7800H #9265148 for sale

HITACHI S-7800H is a scanning electron microscope (SEM) that utilizes a secondary electron detector, allowing high resolution imaging of finely detailed features on microscopic samples. It is equipped with a unique Field Emission Gun (FEG) that enables a resolution of 0.9 nm at 1 kV sample voltage. The FEG also allows for a low accelerating voltage to reduce specimen damage, while creating dynamic images of the sample with a high degree of detail. HITACHI S-7800 H has an easy to use interface and great functionality that allow accurate and efficient sample imaging capabilities. The automatic stig-shift feature is able to accurately align images and sample droplets. It also has an automated scan size and time selection capability which ensures accurate imaging with minimal user intervention. The sample chamber is heated and humidity controlled, to maintain a stable environment. The microscope has a well-illuminated independent viewing monitor with a touch panel control and a 10 inch LCD monitor. S-7800H is equipped with an advanced imaging equipment made up of an accumulative multi-detector acceleration system. This unit monitors and analyzes images from various detectors in the control off-axis Ga detector, backscattered electrons, secondary electrons, and reflected electrons. By obtaining information from a variety of detectors, it is possible to image different physical properties of the sample with a higher accuracy and resolution. S-7800 H produces high-quality images with its advanced detectors. Its CCD cameras capture the image of the sample in a very short time while its large area array camera delivers detailed images with high resolution. The machine also has a micro-image observation software which allows one to observe samples using overlaid imaging modes, allowing for an accurate comparison of various samples and imaging modes. HITACHI S-7800H also has many advanced features that it ensures a reliable operation. It offers an automated image capture tool, a fully automated optical alignment process, and a signal-to-noise ratio optimization asset that ensures accurate and reliable images. The various detectors fitted onto the microscope are able to detect particle distributions, particle size and composition, and trace element data. The microscope has an integrated data acquisition software which is able to store data from the microscope, image processing software for image processing, and a spectral analysis software which enables analysis of data. HITACHI S-7800 H is designed for optimal performance and accuracy which is evidenced by its 0.9 nm resolution at 1 kV sample voltage. This is further complemented by its advanced analysis and imaging capabilities, making it a great asset for any research and industrial environment.