Used HITACHI S-7800H #9373119 for sale

HITACHI S-7800H scanning electron microscope (SEM) is a powerful analytical instrument that enables scientists and engineers to view, analyze, and measure particles on the nanoscale. The instrument uses electrons instead of light to magnify and form images of particles, offering a level of resolution that exceeds light microscopy. HITACHI S-7800 H contains a number of features to ensure accurate results when studying nanomaterials. It has an energy filter system that filters electrons according to their energy level to create a detailed image with high contrast. The electron gun provides a high acceleration voltage (up to 30 kV) to effectively analyze nanomaterials and very small samples. The in-column secondary electron detector allows for the analysis of conductive and non-conductive samples. S-7800H also provides a wide range of imaging modes including backscatter electron imaging, secondary electron imaging, elemental analysis by EDX and WDX, and crystal defect analysis. Backscatter electron imaging is useful for investigating the composition and surface topography of a sample, while secondary electron imaging enables the user to view the sample from a different angle. The EDX and WDX detectors enable rapid elemental analysis of the sample. S-7800 H is also equipped with robotic sample changer technology for rapid analysis of multiple samples. The automated changer can handle up to 12 samples at a time, and allows for quick and seamless transition between samples. In addition, the instrument can be controlled and monitored remotely using the Wi-Fi system. HITACHI S-7800H SEM is a reliable and user-friendly tool that combines powerful analytical results with intuitive controlling software. Its unmatched resolution and imaging capabilities allow for comprehensive nanomaterial analysis. The instrument is the perfect choice for scientists and engineers looking to gain insights into the nano-world.