Used HITACHI S-7840 #293643102 for sale
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ID: 293643102
Wafer Size: 8"
Vintage: 2001
Critical Dimension Scanning Electron Microscopes (CD-SEM), 8"
2001 vintage.
HITACHI S-7840 is a high performance scanning electron microscope (SEM) specifically designed for advanced materials characterization. This instrument is configured with a newly designed electron optical column, featuring a 30 kV high pressure thermionic field emission gun for increased resolution and low noise observations. It features high performance sample observation capabilities due to its large etched angle lens and higher contrast imaging abilities. HITACHI S 7840 includes a glass chamber, automated specimen scanning stage and an environmental EM shield that provide a clean ultra-high vacuum (UHV) equipment with a base pressure of 5 x 10-7 Pa. The integral high vacuum system also prevents dust, atomic particles, and other contamination from entering the instrument, thereby allowing analysis of the sample surface with higher resolution and greater accuracy. The integrated CCD camera and image data processor allow for the generation of high resolution digital images. An array of up to five detectors can be used with the SEM to obtain data from the sample. These detectors include secondary electron (SE), backscattered electron (BSE) and fluorescent X-ray detectors. S-7840 also features a non-contact type independent double secondary electron image detector for obtaining images without being disturbed by the primary electron beam. The instrument contains a variety of advanced features to maximize resolution and accuracy. For example, the specimen holder features an in-column stage for the horizontal scanning of all sample types. The stage is tilted, rotatable and adjustable so that specimens of all shapes, sizes and materials can be scanned from any orientation. The electron gun has a 0.5 nm spot focusing capability, and the detector assembly has an RMS unit resolution of 2.5 nm. S 7840 also has a wide range of optional accessories and software, such as an auto scanning machine and a micro analysis tool, to maximize its already powerful capabilities. All of these components come together to make HITACHI S-7840 a high performance SEM capable of providing superior imaging and analytical results for all types of materials research.
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