Used HITACHI S-7840 #293794880 for sale

HITACHI S-7840 is a scanning electron microscope (SEM) which is used for performing microanalysis of various materials by using electron beam. It has a field of view ranging from 0.5 to 3000 microns, with practical magnification varying from 50x to 50000x. The microscope also incorporates a backscattered electron detector which can be used to determine the surface features of the specimen. It also has an additional secondary electron detector which is used to acquire micrographs with an increase in the sensitivity, resolution, and contrast. Moreover, the vacuum system of the microscope allows for a maximum pressure of 1 × 10-4 Pa, enabling it to reach excellent specifications in the electron optics and digital imagery. This system includes a high resolution Electron Beam gun, Camera column and Signal processing electronics. The gun has perveance of 0.5ma/V and a spot diameter of 0.1 nm. The camera column incorporates a quantum-magnitude lens and an array of detectors for detecting the secondary electrons. The signal processing electronics is responsible for forming the image on the monitor based on the information obtained by the gun and the array detectors. The microscope can be used for a various range of applications like x-ray mapping, crystal structure analysis and reconnaissance studies. It also has image processing built in the SEM software operations to allow for more extensive analysis. Furthermore, the operating software contains a set of user friendly features such as montage functionality, electron beam blanking and energy filtering, making it easy to use. This SEM will provide high quality imaging and analysis capabilities with its combination of excellent electron optics, vacuum system and digital imaging parameters. All of these features make HITACHI S 7840 an ideal choice for those seeking the excellent capabilities of a scanning electron microscope.