Used HITACHI S-7840 #293800274 for sale

HITACHI S-7840 is a scanning electron microscope (SEM) created by HITACHI High Technologies. Ideal for research and development, this SEM is capable of providing extremely high levels of performance and accuracy. HITACHI S 7840 boasts many advanced technologies to produce high-resolution imaging and measurement results. The SEM boasts an aberration-corrected field-emission electron source (FES) which allows for highly controlled and focused beam energies and illumination. This gives S-7840 greater beam stability and higher levels of contrast and resolution. Additionally, the high level of beam stability allows for faster scanning and higher quality imaging. S 7840 is also equipped with a large, high-resolution display for display of acquired images. The display is located in front of the instrument, which gives users access to image manipulation and direct comparison. The display features an intuitive and intuitive user controls, providing users with more flexibility in their work. HITACHI S-7840 also features a digital image analysis system which allows for sophisticated image analysis. This system provides users with powerful data analysis capabilities through geometrical, contrast, and gradient analysis. In addition to its advanced imaging technologies, HITACHI S 7840 also boasts an automated sample stage. This stage allows for automated sample positioning and measurement. The sample stage also quickly accommodates sample replacement, allowing for accurate and repeatable measurements. S-7840 is also compatible with a wide range of sample holders and accessories. This includes holders for specimens up to 400mm in size, various shaped specimens, and specimens in a wide range of materials. S 7840 also features a preparatory chamber with a built-in vacuum pump for controlling chamber conditions. This is especially useful for coating delicate specimens with a thin, non-conductive layer. Overall, HITACHI S-7840 is an advanced and feature-packed tool for imaging and measuring a wide range of material samples at the nano scale. Its advanced imaging technologies and automated sample stage makes it the perfect tool for research and development.