Used HITACHI S-7840 #293801744 for sale
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ID: 293801744
Wafer Size: 8"
Vintage: 2001
Critical Dimension Scanning Electron Microscope (CD-SEM), 8"
Automatic Defect Review (ADR)
Automatic Defect Classification (ADC)
2001 vintage.
HITACHI S-7840 is a powerful scanning electron microscope (SEM) that provides high-resolution imaging and sophisticated analysis capabilities for a variety of materials and applications. This model of SEM is especially suited for use in the field of nanotechnology and advanced materials research. HITACHI S 7840 features a specially designed column, which enables rapid and high resolution imaging of surfaces at a magnification range of 10x to 500,000x. The column features a nanostage, on which specimens can be positioned (X, Y, and Z axes), and a digital deflection equipment, which controls the focused beam of electrons. The digital deflection system also provides active cooling of the electron optics. S-7840's imaging capabilities are impressive, capable of recording images of nanoscale patterns, textures and surface topography. The SEM employs advanced imaging technology such as high angle annular dark field imaging (HAADF) which enables one to see the composition of complex specimens. Additionally, the Automated Feature Recognition (AFR) unit automatically captures static and dynamic images of samples, enabling detailed and accurate analysis. Aside from imaging, S 7840 is capable of performing sophisticated analytical measurements. It is equipped with an EDX (energy dispersive X-ray spectroscopy) machine, which enables one to analyze the chemical composition of samples. It utilizes an advanced secondary electron imaging combine with EDX spectroscopy to achieve immensely accurate results. HITACHI S-7840 is easily and clearly controlled by the user through its touch screen interface. It has four operating modes - photography and observation, measurement and microanalysis, elemental analysis and imaging and pattern recognition - allowing users to switch between tasks quickly. Additionally, it has a wide range of built-in user events and application forms, allowing users to personalize their workflow. Finally, it features a powerful reporting tool with automated, parameter based report generation and saving. HITACHI S 7840 is a revolutionary scientific SEM that provides an all-in-one solution for high-resolution imaging and analysis. It is the perfect tool for nanoscale research projects and advanced materials analysis, offering great precision, accuracy, control and flexibility.
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