Used HITACHI S-7840 #293814830 for sale

ID: 293814830
Critical Dimension Scanning Electron Microscope (CD‑SEM).
HITACHI S-7840 is a scanning electron microscope (SEM) used in materials science research. It has a field emission type electron gun which provides electrons with a lower energy spread and higher brightness compared to other SEMs. Its compact design allows for easy installation in small environments. In addition, it has a wide magnification range capable of magnifications up to 10,000 times. It also has an excellent depth of field, allowing resolution of objects as small as 1 nanometer. HITACHI S 7840 provides excellent image resolution due to its high accelerating voltage. It can achieve a voltage up to 30 kV, allowing for a higher resolution of small features and greater depth of field. The acceleration voltage is also adjustable, allowing for detailed analysis of materials such as semiconductors that are affected by electron beam damage. S-7840 also includes a number of analytical capabilities. It provides Energy Dispersive X-ray spectroscopy (EDX) for elemental analysis and X-Ray fluorescence mapping for composition mapping. Both of these techniques are used to determine the composition and structure of the material being studied. Other advanced capability includes backscattered electron imaging, providing information on the shape and 3-D structure of the material. S 7840 has a user-friendly and intuitive graphical user interface. This makes the SEM easier to use and allows for faster image acquisition. In addition, the standalone software suite of HITACHI S-7840 allows for complete control of the microscope, from adjusting parameters, to analyzing results. Overall, HITACHI S 7840 is an effective scanning electron microscope which is capable of high-resolution imaging, as well as high-quality analytical analysis. Its compact design yet high performance make it an ideal choice for researchers in materials science.
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