Used HITACHI S-7840 #9225865 for sale

HITACHI S-7840 is a high-performance scanning electron microscope (SEM) designed for advanced imaging capabilities. Its superior analytical capabilities make it ideally suited for research applications in a wide variety of fields. It features a highly sensitive energy-dispersive X-ray spectrometer (EDS) and a high-resolution secondary-electron imaging system. HITACHI S 7840 has a maximum acceleration voltage of 30kV and is equipped with a 0.5nm resolution imaging system. It is capable of scanning samples up to 50mm in diameter and has an integrated sample stage for precise sample manipulation. S-7840 has high sensitivity at low accelerating voltages, as well as a low electron beam current density for delicate imaging operations. The imaging system of S 7840 uses a secondary electron detector and a backscattered electron detector, combined with a brightfield detector, for high-contrast images. HITACHI S-7840 also has an optional electron backscatter diffractor (EBSD) and an optional energy-dispersive X-ray spectrometer (EDS), for enhanced analysis capabilities. HITACHI S 7840 is easily programmable for automated image acquisition and can also be controlled from a remote PC by using the special imaging software the model is equipped with. It is also capable of acquiring 3-D images using its special 3-D feature as well as being able to align its stage with an external sample, using its automatic alignment feature. In terms of its capabilities in terms of resolution and speed, S-7840 is exceptionally fast and accurate, and is able to detect sub-micron resolution features in samples. Its analytical performance, fast imaging speeds, and versatile application make it suitable for many research applications in the fields of molecular biology, material science, and nanotechnology. In addition, its automated operation and easy integration with other systems make it a highly efficient and flexible imaging solution. In conclusion, S 7840 is a superior scanning electron microscope designed for advanced imaging and analysis capabilities. Its superior sensitivity, resolution and speed make it an ideal choice for research and industrial applications. Its versatile features and easy programmability make it a highly efficient and reliable imaging solution.