Used HITACHI S-800 #9270027 for sale

HITACHI S-800 Scanning Electron Microscope (SEM) is a high-end model from HITACHI High Technologies Corp. that excels in providing maximum performance and precision at very high magnifications. The SEM is equipped with a digital imaging system suitable for a wide range of applications, including material and nanoscale analysis. HITACHI S800 employs a high-performance magnetic field coil-cluster electron optical column with the addition of an additional column for optimal image and signal contributions from the sample. This structure enables an ultra-fine electron probe size of less than 5 nm in diameter, enabling cellular imaging and nanoscale analysis. The instrument comes with a wide range of detection system options to optimize the varying conditions of sample investigation, such as electron energy loss spectroscopy, X-ray, secondary electron, and backscatter electron detection. Moreover, one-dimensional and two-dimensional viewing are both possible, enabling analysis of multiple locations such as defects and individual particles. S-800 has a user interface which is easy to learn and enables the monitoring of overall microscope operating performance. Its graphical user interface (GUI) provides ease of operation, allowing the user to switch between any operations such as image acquisition and analysis while still under the scanning electron beam. Various functions are available for digital analysis, including image processing, 3D analysis, and automated grain counting, allowing for efficient and powerful SEM imaging. The device includes a 3D image measurement feature, which allows for the measurement of 3D surface features ranging from 0.2 to 100 µm in diameter. Furthermore, S800 includes a high contrast resolution of over 10,000:1, providing excellent visualization of surface features and subtle differences. This high resolution image quality, paired with automatic image stitching software, allows for seamless images of up to 1 mm in diameter. Overall, HITACHI S-800 provides excellent performance and precision for a wide range of applications. Its cutting-edge features, combined with its efficient user interface, gives it a distinct advantage in timesaving and imaging quality over other SEMs.