Used HITACHI S-8500 #9243280 for sale

HITACHI S-8500 is a scanning electron microscope (SEM) that provides high resolution imaging and analysis capabilities to researchers in many fields. S-8500 SEM is equipped with an advanced analytical components such as a high resolution field emission source, wide bandwidth digital signal processors and a high performance imaging system. This system offers superior performance in imaging, especially in low-vacuum and low-dynamic range applications. HITACHI S-8500 SEM's Field Emission Source (FES) provides high current and current stability for sub-micron resolution imaging. The electron optics features 10-100 nano-meter resolutions as well as a range of scan speeds, from 1 - 110 frames per second. All components, from the electron gun to the detectors, are adjustable and set for optimized performance. S-8500 SEM's imaging system enables researchers to capture images of samples with incredibly high detail across a range of vacuum pressure and acceleration voltage. HITACHI S-8500 SEM provides researchers with a variety of tools for material analysis and characterization. X-ray Imaging (X-ray Detector and Energy Dispersive X-ray (EDX)) can provide elemental information about samples being analyzed. The BSE Detector (Backscattered Electron) allows for 3D imaging in a vacuum environment. Resistivity and Secondary Electron Imaging (SEI) can be used with S-8500 to analyze surface characteristics. HITACHI S-8500 SEM combines these analysis capabilities with a variety of advanced software features. These include Automatic Image Alignment, Image Processing, Morphology Analysis, Standardized Reports, and more. S-8500 is also built with multiple user access levels and can be configured for multiple users, allowing groups to collaborate on a project or use the SEM simultaneously. HITACHI S-8500 SEM is a versatile scanning electron microscope ideal for researchers needing high resolution imaging, advanced imaging features, and a wide range of material analysis capabilities. It is the perfect tool for biologists, chemists, material scientists, and many other scientists needing to capture and analyze the details of microscopic specimens.