Used HITACHI S-8600 #9144956 for sale

HITACHI S-8600
ID: 9144956
Wafer Size: 6"
Scanning electron microscope (SEM), 6".
HITACHI S-8600 Scanning Electron Microscope (SEM) is a multi-purpose electron microscope designed to meet the needs of both research and industrial applications alike. S-8600 features a state-of-the-art field emission (FEG) in-lens electron source that produces a primary beam with a low-astigmatism shape. The high brightness generated by this design provides an excellent signal-to-noise ratio for outstanding image quality. HITACHI S-8600 is versatile and offers a wide range of capabilities and applications. Its probe voltage range from 1kV to 30kV and its maximum magnification ranges up to 800,000X. The Back Scattered Electron (BSE) detector has its own scan control so that separate images with different magnifications can be obtained. S-8600 is also an excellent tool for elemental analysis with its built-in EDS (Energy Dispersive X-ray Spectroscopy) which provides spectral analysis up to 8.0keV. HITACHI S-8600's stage can be configured for either manual or automated operation. Its fully-enclosed motor-driven stage has a wide range of travel (300 x 400mm) and can also be programmed to travel to specimen coordinates for repeatable and precise operation. S-8600 also features an innovative plasma-assisted sample preparation (PASP) system. This system helps to reduce specimen charging by creating an argon atmosphere over the sample chamber, allowing for the cleaning of specimens using a process called Ar sputter. This process extends the use of HITACHI S-8600 to a variety of materials from insulating materials, to carbon-containing compounds, to very thin biological samples. In addition to S-8600's excellent imaging capabilities, it is also ideal for materials analysis. Its dual back-scatter detector is used to measure the elemental composition of the specimens. It's unique in-lens detector also provides superior topographic images and eliminates image distortion caused by astigmatism. Overall, HITACHI S-8600 is a multi-function scanning electron microscope offering top quality imaging and sample analysis capabilities for both research and industrial applications. Its wide range of capabilities and user-friendly operation makes it an ideal choice for a variety of applications.
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