Used HITACHI S-8620 #293764337 for sale

HITACHI S-8620 is an advanced-level scanning electron microscope (SEM) designed for research, academic, and industrial applications. It is a highly versatile instrument used to characterize the surface features of specimens at different levels of detail, ranging from individual atomic structures to entire particles. It enables the equipment operator to visualize specimens and to make detailed measurements of various physical and chemical properties. HITACHI S 8620 utilizes a cold-magnification field-emission gun (SEM-FEG) for its electron-optical system, which is capable of producing a high-resolution electron microscope image in a wide range of magnifications from 0.2 μm to 5,000,000×. The scanning electron beam emitted by the cold-magnification gun is capable of producing extremely detailed images with a maximum resolution of 0.8 nm. Furthermore, S-8620's electron image sensors offer an extremely fast acquisition rate, NDR (non-destructive readout) technology, and improved dark-noise performance. S 8620 is also equipped with a high-energy resolution electron energy loss spectroscopy (HREELS) unit, which enables the user to measure the composition of surfaces of the specimen with high accuracy. HREELS provides the ability to detect minor differences between different specimens, which enables the user to perform analytical research on the samples. HITACHI S-8620's X-ray analysis machine is able to measure the compositions of different layers of a specimen, thereby offering a powerful tool for in-depth analysis of a sample. The tool is also equipped with an energy-dispersive X-ray spectroscopy (EDS) detector and a quartz crystal monitor (X-ray Segmentation Monitor), both of which can be used to measure the composition of a specimen's surface and to look for natural trace elements and contaminants. In addition, HITACHI S 8620 is equipped with a multi-layer control asset and a sample-holding mechanism, which provide easy and precise positioning of samples. The model's automatic sample exchange and auto-focus functions enable the user to quickly switch between samples and to set the correct focus automatically. S-8620 also features a variety of imaging and analysis software that allows the user to efficiently extract and analyze multiple images, to automatically measure and compare features of specimens, and to generate a variety of measurement and analysis data. The equipment supports both offline and online data collection and processing, enabling the user to perform various types of experiments and analysis from a remote location. S 8620 is a powerful and versatile scanning electron microscope, which provides the user with a variety of advanced tools for imaging and analyzing a wide range of specimens. With its excellent performance, robust design, and intuitive control system, it is an ideal platform for research and industrial applications.