Used HITACHI S-8800 #9265146 for sale

HITACHI S-8800 is a highly advanced scanning electron microscope (SEM) capable of achieving the highest resolution imaging for a variety of samples. It is one of the most advanced instruments for imaging and analysis in the world due to its high level of resolution, coupled with its effective imaging speed. S-8800 is equipped with a field emission gun (FEG) scanning electron source, which is capable of generating high-precision images at resolutions lower than 10nm and magnifications up to 500,000x. This allows the microscope to image nanostructures with remarkable clarity and detail. Also, the FEG source leads to an improved signal-to-noise ratio, as well as reduced background noise. HITACHI S-8800 features two different parallel imaging modes to enhance imaging speed while minimizing the effect of charging artifacts. The 'collection semiconductor imaging' (CSI) mode yields high-resolution imaging, while the 'secondary electron imaging' (SEI) mode provides a higher image coverage rate. The probe-forming capability allows the microscope to detect small changes in charge density, allowing for detailed analysis of specimen structure and composition. Specialized imaging systems are also available, including detectors for secondary electrons, backscatter electrons (BSE), and various types of energy-dispersive X-ray spectrometry (EDS). S-8800's sample stage is equipped with a fast feed-through X-Y motor drive, which allows the specimen to be moved quickly and precisely to the desired location for imaging. The sample stage is also capable of accommodating a large variety of specimen holders, including cryo-holders and environmental chambers. In addition to its imaging capabilities, HITACHI S-8800 also provides various analysis tools, including 3D image analysis, film thickness measurement, image-based particle sizing, high-speed image capture and analysis, and automated full-frame imaging with temporal averaging. S-8800 is an incredibly powerful instrument, capable of providing extremely high-resolution images and powerful analysis for many different sample types. This versatility, combined with its fast and reliable imaging performance, makes it a great choice for research across multiple disciplines.