Used HITACHI S-8820 #293608915 for sale

HITACHI S-8820
ID: 293608915
Wafer Size: 4"
Scanning Electron Microscopes (SEM), 4".
HITACHI S-8820 is a scanning electron microscope (SEM) designed to observe, analyze and image electrical, chemical and physical qualities of specimens at high magnifications. It utilizes repeated scanning and electron-beam stimulation to produce images with high resolution and contrast. HITACHI S 8820 offers high-speed scanning and performance capabilities with its large computer memory for rapid imaging and processing. It features a wide selection of modes, including secondary and low-vacuum scanning. This instrument is able to generate images with maximum lateral resolution at 15 Nano-meters, along with 3D imaging capability, high brightness and extended depth of field. S-8820 is purpose built and highly versatile, enabling its user to fully tailor the instrument to their needs. With adjustable beam acceleration and scanning speeds it can be tailored to the desired application. Additionally, its tilt & rotation mount enables advanced experiments to be conducted. S 8820 scanner is equipped with a unique Electron Optical Equipment (EOS) developed expressly for upgrading magnified performance, resulting in sharp and clear imaging. The new EOS also features an anti-distortion system for stable, accurate imaging with reduced distortion. Additionally, this model supplies a fast "Live Scan" mechanism which improves the speed of image acquisition. Other unit accessories option are electronic beam stability, digital joystick interface, and rapid-scan-and-roll options, which all improve the level of automation of the machine. The advanced imaging technologies of HITACHI S-8820 enable powerful detection and imaging of samples with dynamic features, such as environmental sensitivity and bacteria-like structural features that may require high resolution. This SEM is a powerful tool for researching electrical, chemical and physical properties of materials. The images generated by HITACHI S 8820 provide insights into the analysis, identification and inference of such properties, ultimately helping scientists and researchers to provide knowledge and understanding of samples.
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