Used HITACHI S-8820 #293618031 for sale

HITACHI S-8820 scanning electronmicroscope (SEM) is a analytical instrument used to provide information on the morphology, composition, and topographical features of a wide range of sample materials. It uses a scanning electron beam to scan a sample surface, and then measures and stores the signal detected from the electronsbackscattered from the sample. The SEM also enables the user to acquire elemental compositional analysis from selected areas of the sample. HITACHI S 8820 utilizes an enhanced vacuum system to ensure stable performance with a wide range of samples up to a vacuum pressure of 1.0 × 10^-4 Torr. This model has a triple-stage turbo molecular pump and a rotary vane booster pump, in combination with wet and dry diffusion pumps, to provide optimal high-vacuum operation. A flat-panel monitor and touchscreen panel provide a clear view of the instrument data and control functions. The SEM has an advanced secondary electron detector for imaging and collecting high-resolution images to measure microstructure, topographical features and elemental composition in the sample. The powerful Everhart-Thornley detector provides a low-noise, higher resolution image with a large depth of field. An on-board energy filter allows the user to select an energy band in which the electron signal is collected from the sample. The large-format detector also has a special coater unit for safe and repeatable sample coating. S-8820 also has an optional analytical chamber for microscopic samples, enabling it to be used for in-situ analysis such as EDX, EBSD, and WDS. The in-situ analysis capabilities enable the user to achieve real-time observation and analysis of the sample without interruption of the vacuum environment. The versatile stage of S 8820 lets the user to make XY, XYZ scan and provide tilt and rotation, as well as multiple control. The precise incremental step is available with built-in adjusting range, motor movement accuracy and speed. Overall, HITACHI S-8820 is a powerful, versatile and reliable scanning electron microscope capable of providing a high level of sample detail and precise elemental compositional analysis. Its advanced secondary electron detector, energy filter and optional analytical chamber provide users with the ability to quickly and effectively observe and analyze a wide range of samples.