Used HITACHI S-8820 #293621554 for sale

HITACHI S-8820 Scanning Electron Microscope is a SEM designed for a broad range of applications, from analysis of elemental composition of organic or inorganic specimens to 3D analyses and real-time imaging of dynamic events. The equipment's high-performance enlargement optics, secondary electron detector and X-ray detector guarantee superb precision imaging. HITACHI S 8820 Scanning Electron Microscope is equipped with several acquisition modes and advanced analytical abilities, such as secondary electron imaging, back scattered electron imaging, EDS (energy dispersive X-ray spectroscopy) and EBSD (electron back scattered diffraction). The system's high performance enlargement optics ensure clarity and sharpness of the imaging, while the small size of the features easier to observe in the SEM. The Scanning Electron Microscope also offers the ability to observe dynamic events and analyze three-dimensional features using EDX (energy dispersive X-ray) mapping. The feature tracking unit allows the study of dynamic events in real time. The EBSD machine allows grain structure, texture, and crystal orientation determination. The low vacuum tool enables imaging of non-conductive samples, while the environmental and coating systems allow the study of environmental effects, characterizing interface reactions and the addition and removal of thin coatings. The optional in-lens imaging asset minimizes backscatter and enhances the overall performance of the SEM. Further, S-8820 Scanning Electron Microscope provides a larger specimen chamber for both samples of large size and a wider field of view for imaging. Its high resolution and long working distance allow for the integration of microscopy and analytic techniques. The SCATRAP device is a useful feature on the model that helps enhance the resolution of imaging by suppressing the effects of residual gas. The atmosphere of the specimen chamber can be controlled to analyze fragile particles. S 8820 Scanning Electron Microscope provides many analytical capabilities, making it a suitable tool for a wide range of applications ranging from quality inspection to research and educational fields. It provides automated processes such as automatic alignment, sample loading and sub-sampling.