Used HITACHI S-8820 #9093025 for sale

HITACHI S-8820 scanning electron microscope (SEM) provides an unparalleled level of accuracy and detail in imaging samples of all kinds, especially those which are too small to be seen by the naked eye. With its high resolution, high comparison, and an abundance of digital image processing capabilities, HITACHI S 8820 offers an impressive range of digital microscopy options. S-8820 utilizes an advanced electron beam gun that allows for precision sample focusing, improved vacuum stability, and output current operation. This is made possible by the addition of cold field emission gun that allows for a lower-than-normal beam gun voltage to be used, thus providing optimal acceleration voltage. S 8820 also employs new charge compensation systems (ionic wind) and secondary electron detectors that improve imaging contrast and resolution, allowing for improved image contrast and clarity. HITACHI S-8820 is equipped with a large field of view and various integrated stage controls, making sample navigation and operation easier and more precise. The SEM is able to capture high resolution images in a variety of orientations and magnifications, allowing for a greater level of accuracy and precision when measuring a range of sample sizes. It comes equipped with a CCD camera detector to capture digital images from the sample areas, which can be saved with an JEOL/HITACHI digital image processing system. In addition, there is an optional Magnification Stabilized Contrast Digital Radar (MSCDR) that can adjust the contrast and brightness of the digital image quickly. HITACHI S 8820 also features a motor-driven stage for sample positioning, with translation and angular adjustment controls, as well as manual microscope control with digital display. It is also equipped with a computer-controlled image analysis system that allows for easy measurement of sample features and predefined areas of interest. In addition to its standard features, S-8820 also comes with a number of additional optional features. These include bi-polar mode, signal processing, signal testing, and remote control functions. Furthermore, S 8820 is compatible with a variety of software that allows for additional control over the microscope, including automated scanning and manipulation, as well as basic and advanced controls. The software can even be used to generate and analyze data from acquired images. Overall, HITACHI S-8820 scanning electron microscope offers impressive imaging capabilities, with the precise control over sample positioning, magnifications, and contrast. It is an ideal choice for accurate imaging and precise measurements of small samples, and is designed to meet the rigorous standards of most industrial and academic research institutions.