Used HITACHI S-8820 #9170906 for sale
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ID: 9170906
CD Scanning electron microscope (SEM), 8"
Substrate type: 8" Silicon wafer / (2) Ports
HV Controller
MHV PCB
NDEF / LENS PS
Stage controller
EVAC Controller
TMP Controller 1, 2
Utility indicator
Linear counter
COL-CN PCB
ST Sensor PCB
Linear amp
TMP 1, 2
COL-DCPS
Ion pump power
AV3 Gate valve assy
Halogen lamp assy
Solanoid assy
Bake assy
Gun head
Stage driver X,Y
ION Pump backup
Battery
VME Rack:
ECPU263
COGNEX 4400
PS Disp
IMEM
EO CONT
SIP PCB
ECONT
SGVA
NOMAFC
Power supply:
EWS UPS
NIP PCB
IP Power supply unit
Main power supply unit
Transfer unit ((2) ports):
Pre aligner
Transfer robot
Teaching box
Robot controller
(2) Vacuum pumps
CRT Monitor
Transfer box
Exhaust line
1994 vintage.
HITACHI S-8820 is a scanning electron microscope (SEM) that provides highly detailed and accurate visual images of the microscopic surface of materials. This SEM has a wide range of features, making it suitable for a variety of applications, including research, production and engineering quality control, material characterization and failure analysis. The equipment is equipped with a compact electron source and a highly sensitive multi-channel digital detector which allows for an effective observation of different modifications and differences in materials at high magnifications. HITACHI S 8820 scanning electron microscope is equipped with a wide range of imaging capabilities, enabling images of up to 0.6nm. The system is capable of displaying fragile, three-dimensional surface structures as well as standardized variables, including topographical and dimensional profiles. Furthermore, 3D imaging of the nano-dimensions range can be realized with the combination of a backscattering detector and an energy-filter detector. Additionally, the unit incorporates an observation unit that can accommodate larger samples, making it perfect for observing large and physically sensitive samples. S-8820 is equipped with a large GIS and FIB that provides reliable and accurate secondary electron imaging and element analysis capabilities. The FIB is combined with an energy-filter detector, which means that it can deliver ultra-high resolution micro-structure analysis even for highly challenging samples. Additionally, S 8820 comes with a set of advanced features, including environmental SEM which allows for observation of materials under a variety of settings, including vacuum, low/medium vacuum and atmospheric pressure. Overall, HITACHI S-8820 is an excellent choice for any researcher or engineer. The machine has a wide range of imaging capabilities, is capable of imaging nano-dimensions, and can handle large and physically sensitive samples. Furthermore, the tool is equipped with advanced features such as environmental SEM, secondary electron imaging, and element analysis. With so many features and capabilities in one package, HITACHI S 8820 is a great choice for any application.
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